Statistical Mechanical Treatment For the Electrical Double Layer at Ities: Analysis of MVN Model

Authors

Jintian Wu, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050;
Shengpei Chen, State Key Laboratory of Physical Chemistry of Solid Surface Department of Chemistry, Xiamen Univ., Xiamen, 361005, China;
Wenduan Su, State Key Laboratory of Physical Chemistry of Solid Surface Department of Chemistry, Xiamen Univ., Xiamen, 361005, China;

Corresponding Author

Wenduan Su

Abstract

A statistical mechanical treatment for electrical double layer at the interface between two immiscible elecrolyte solution (ITIES) is presented by using grand canonical method based on the MVN model. For the MVN model, the ITIES was represented by that the two space charge regions are separated by an inner layer of the oriented solvent molecules. Assuming that the ions were allowed to penetrated into the solvent compact layer over some distance, then the grand canonical partition function of the inner layer at ITIES can be given. While the mean field approximation is employed to estimate the interactive potential energy of the system, including the dipole dipole, dipole ion and ion ion interaction. A relationship between the differential capacity and the surface charge fluctuation is shown, and the statistical expression of inner layer differential capacity (C 1) is derived. A fitting curve of the C 1 as a function of surface charge density ( σ m ) at water/nitrobenzene interface is given, which is agreed with the generally theoretical inferences.

Keywords

ITIES, Electrical double layer, Inner layer differe

DOI Link

https://doi.org/10.61558/2993-074X.3072

Publication Date

1996-05-28

Online Available Date

1996-05-28

Revised Date

1996-05-28

Received Date

1996-05-28

Recommended Citation

Jintian Wu, Shengpei Chen, Wenduan Su. Statistical Mechanical Treatment For the Electrical Double Layer at Ities: Analysis of MVN Model[J]. Journal of Electrochemistry, 1996 , 2(2): Article 12.
DOI: 10.61558/2993-074X.3072
Available at: https://jelectrochem.xmu.edu.cn/journal/vol2/iss2/12

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