Fabrications and Characterizations of Porous Silicon by Tow-step Techniques I:Constant Current Application

Authors

Xuan CHENG, State Key Lab. for Phys. Chem. of Solid Surfaces, Dept. of Chem., Xiamen Univ.,Xiamen 361005, China;
Feng ming LIU, Department of Chemistry, ** Department of Materials Science State Key Laboratory for Physical Chemistry of Solid Surfaces *** Center for ;
Chang jian LIN, Department of Chemistry, ** Department of Materials Science State Key Laboratory for Physical Chemistry of Solid Surfaces *** Center for ;
Zuo-xin WEN, Department of Chemistry, ** Department of Materials Science State Key Laboratory for Physical Chemistry of Solid Surfaces *** Center for ;
Zhong-qun TIAN, Department of Chemistry, ** Department of Materials Science State Key Laboratory for Physical Chemistry of Solid Surfaces *** Center for ;
Ru XUE, Department of Chemistry, ** Department of Materials Science State Key Laboratory for Physical Chemistry of Solid Surfaces *** Center for ;

Corresponding Author

Xuan CHENG(xcheng@xmu.edu.cn);
Chang jian LIN;
Ru XUE

Abstract

Porous silicon structures were formed by a two step technique consisting of electrochemical polarization and chemical oxidation processes in 1∶1 hydrofluoric acid and ethanol solutions. A constant current density of 0.03 A/cm 2 was applied to p type silicon wafers, followed by chemical treatment in 20% nitric acid solutions. These samples were then carefully examined by scanning electron microscope (SEM) and Raman spectrometer to study their surface morphologies and optical properties. After a year storage in a desiccator, the aged porous silicon samples were re examined by SEM and Raman spectrometer before and after treated with styrene and decene(1) organic solvents, respectively. It was found that the Raman intensities of the aged porous silicon samples were significantly enhanced. However, the treatments of the aged porous silicon samples with tow organic solvents did not alter their optical properties.

Keywords

Porous silicon, Photoluminescence

DOI Link

https://doi.org/10.61558/2993-074X.1401

Publication Date

2000-11-28

Online Available Date

2000-11-28

Revised Date

2000-11-28

Received Date

2000-11-28

Recommended Citation

Xuan CHENG, Feng ming LIU, Chang jian LIN, Zuo-xin WEN, Zhong-qun TIAN, Ru XUE. Fabrications and Characterizations of Porous Silicon by Tow-step Techniques I:Constant Current Application[J]. Journal of Electrochemistry, 2000 , 6(4): 399-405.
DOI: 10.61558/2993-074X.1401
Available at: https://jelectrochem.xmu.edu.cn/journal/vol6/iss4/3

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