Abstract
X-ray photoelectron spectrum and characteristics of the capacity,versus thevoltage of the thin film devices are measured to study the surface states of the zinc sulfide thin film.The transient electroluminescence excited by pulses shows the relaxation luminance peaks during anon-exponential decay process of the characteristic transitions activated by Er￣(3+) in the ZnS directcurrent thin film electroluminescence (DCTFEL) devices.The surface structures of ZnS:Cu,Cl,Erfilm with the absorption of oxygen,and the effect of the surface states on the relaxation luminance ofthe devices are discussed.
Keywords
ZnS thin film, Absorption of oxygen, Relaxation luminance
Publication Date
1995-08-28
Online Available Date
1995-08-28
Revised Date
1995-08-28
Received Date
1995-08-28
Recommended Citation
Yujiang Wang, Zhaohong Liu, Zhenxiang Chen.
Study on the Surface States of Zinc Sulfide Thin Film Doped with Erbium and their Effect on the Relaxation Luminance[J]. Journal of Electrochemistry,
1995
,
1(3): Article 21.
DOI: 10.61558/2993-074X.3047
Available at:
https://jelectrochem.xmu.edu.cn/journal/vol1/iss3/21
Included in
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