Studies of In-situ Raman Spectroscopy on Deprotonation and Degeneration of PPY Films

Authors

Jinsong Gao, State Key Laboratory for Physical Chemistry of Solid Surface, Department of Chemistry, Xiamen University, Xiamen 361005
Jing Chen, State Key Laboratory for Physical Chemistry of Solid Surface, Department of Chemistry, Xiamen University, Xiamen 361005
Yanzhen Chen, State Key Laboratory for Physical Chemistry of Solid Surface, Department of Chemistry, Xiamen University, Xiamen 361005
Qi Xue, Department of Chemistry, Nanjing University, Nanjing 210093
Zhongqun Tian, State Key Laboratory for Physical Chemistry of Solid Surface, Department of Chemistry, Xiamen University, Xiamen 361005

Corresponding Author

Zhongqun Tian

Abstract

By combining the in-situ Raman spectroscopic technique with the normal electrochemical measurements, the behavior and structure of PPY films in neutral or basic solutions were studied. The oxidized PPY loses protons on the N atoms of pyrrole rings and is deprotonated in these solutions, resulting the formation of the quinoid structure. It makes the C=C stretching vibration bonds of PPY split. Because this quinoid structure can′t be further oxidized, the PPY becomes more difficult to be oxidized and less reversible with the increasing of pH value of solutions and the degree of deprotonation of PPY. In the strong basic solution (pH=13), the PPY film is degenerated in the potential region more positive than 0 V. The degeneration may be related to the damage of the pyrrolering structure of PPY.

Keywords

In-situ Rarman spectroscopy, Polypyrrole, Deprotonation

DOI Link

https://doi.org/10.61558/2993-074X.1309

Publication Date

1995-11-28

Online Available Date

1995-11-28

Revised Date

1995-03-01

Received Date

1994-09-29

Recommended Citation

Jinsong Gao, Jing Chen, Yanzhen Chen, Qi Xue, Zhongqun Tian. Studies of In-situ Raman Spectroscopy on Deprotonation and Degeneration of PPY Films[J]. Journal of Electrochemistry, 1995 , 1(4): 389-396.
DOI: 10.61558/2993-074X.1309
Available at: https://jelectrochem.xmu.edu.cn/journal/vol1/iss4/2