Abstract
A method to prepare alternating conducting/insulating substrates by electrodeposition-oxidation was established to facilitate I-E measurements of one-dimensional nanomaterial by CT-AFM. The prepared Au/CuO and HOPG/CuO substrates showed low roughness as well as high uniformity of the alternating conducting/insulating structure, Qualitative I-E measurements were performed on a single carbon nanotube attached to the two above-mentioned substrates, both showing metallic characteristics at room temperature and in air.
Publication Date
2004-02-28
Online Available Date
2004-02-28
Revised Date
2004-02-28
Received Date
2004-02-28
Recommended Citation
Jin-xuan LIU, Juan XIANG, Zhong-qun TIAN, Bing-wei Xiamen University MAO, Xiamen Xiamen, China China.
Substrates Made by Electrodeposition for Measuring Electrical Properties of One Dimensional Nanomaterials[J]. Journal of Electrochemistry,
2004
,
10(1): 20-26.
DOI: 10.61558/2993-074X.1540
Available at:
https://jelectrochem.xmu.edu.cn/journal/vol10/iss1/4
Included in
Engineering Science and Materials Commons, Materials Chemistry Commons, Materials Science and Engineering Commons, Nanoscience and Nanotechnology Commons, Physical Chemistry Commons
