Substrates Made by Electrodeposition for Measuring Electrical Properties of One Dimensional Nanomaterials

Authors

Jin-xuan LIU, State Key Laboratory for Physical Chemistry of Solid Surfaces, Xiamen University, Xiamen 361005, China
Juan XIANG, State Key Laboratory for Physical Chemistry of Solid Surfaces, Xiamen University, Xiamen 361005, ChinaFollow
Zhong-qun TIAN, State Key Laboratory for Physical Chemistry of Solid Surfaces, Xiamen University, Xiamen 361005, China
Bing-wei MAO, State Key Laboratory for Physical Chemistry of Solid Surfaces, Xiamen University, Xiamen 361005, China

Corresponding Author

Juan XIANG(xiangj@mail.csu.edu.cn)

Abstract

A method to prepare alternating conducting/insulating substrates by electrodeposition-oxidation was established to facilitate I-E measurements of one-dimensional nanomaterial by CT-AFM. The prepared Au/CuO and HOPG/CuO substrates showed low roughness as well as high uniformity of the alternating conducting/insulating structure, Qualitative I-E measurements were performed on a single carbon nanotube attached to the two above-mentioned substrates, both showing metallic characteristics at room temperature and in air.

Keywords

One dimensional material, I-E characteristics curve, Conducting tip AFM, Car

DOI Link

https://doi.org/10.61558/2993-074X.1540

Publication Date

2004-02-28

Online Available Date

2004-02-28

Revised Date

2003-09-10

Received Date

2003-08-01

Recommended Citation

Jin-xuan LIU, Juan XIANG, Zhong-qun TIAN, Bing-wei MAO. Substrates Made by Electrodeposition for Measuring Electrical Properties of One Dimensional Nanomaterials[J]. Journal of Electrochemistry, 2004 , 10(1): 20-26.
DOI: 10.61558/2993-074X.1540
Available at: https://jelectrochem.xmu.edu.cn/journal/vol10/iss1/4