Ellipsometric Study on Colored Electroplating of Cuprous Oxide on Ni Substrate

Authors

Xue-song FENG, College of Chemistry and Chemical Engineering,Chongqing University,Chongqing 400044,China;Department of Material and Chemical Engineering,Sichuan University of Science and Engineering,Zigong 643000,Sichuan,China;
Jing-lei LEI, College of Chemistry and Chemical Engineering,Chongqing University,Chongqing 400044,China;
Ai-xiang CHEN, College of Chemistry and Chemical Engineering,Chongqing University,Chongqing 400044,China;
Wan-shan YIN, College of Chemistry and Chemical Engineering,Chongqing University,Chongqing 400044,China;
Ling-jie LI, College of Chemistry and Chemical Engineering,Chongqing University,Chongqing 400044,China;
Sha ZHENG, College of Chemistry and Chemical Engineering,Chongqing University,Chongqing 400044,China;
Hui ZHAO, College of Chemistry and Chemical Engineering,Chongqing University,Chongqing 400044,China;
Shao-yan PAN, College of Chemistry and Chemical Engineering,Chongqing University,Chongqing 400044,China;

Abstract

The colored Cu2O coating was electroplated on Ni substrate to meet the decorative requirements. Results of X-ray photoelectron spectroscopy (XPS) indicate the coating consisting of Cu2O. Images of scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) show that the Cu2O coating is smooth and uniform,and covers the Ni substrate wholly. Ellipsomtric measurements for Cu2O coatings with various electroplating time were carried out. Using a 4-layer model of "Air-Cu2O layer-interphase-Ni" ,the interphase was modeled with the graded effective medium approximation (EMA),the ellipsomtric data were deconvoluted and the Cu2O coatings thickness of Cu2O was obtained. Results reveal that the Cu2O coating thickness increases linearly with the electroplating time.

Keywords

surface treatment, colored electroplating, cuprous oxide, ellipsometry, effective medium approximation

DOI Link

https://doi.org/10.61558/2993-074X.2001

Publication Date

2009-08-28

Online Available Date

2009-08-28

Revised Date

2009-08-28

Received Date

2009-08-28

Recommended Citation

Xue-song FENG, Jing-lei LEI, Ai-xiang CHEN, Wan-shan YIN, Ling-jie LI, Sha ZHENG, Hui ZHAO, Shao-yan PAN. Ellipsometric Study on Colored Electroplating of Cuprous Oxide on Ni Substrate[J]. Journal of Electrochemistry, 2009 , 15(3): 310-314.
DOI: 10.61558/2993-074X.2001
Available at: https://jelectrochem.xmu.edu.cn/journal/vol15/iss3/15

References

[1]WU Tian-cai(吴天才).Electroplating of colored films[J].Electroplating and Finishing(in Chinese),1994,13(2):1-4.
[2]HE Sheng-long(何生龙).Techniques of colored elec-troplating[M].Beijing:Chemical Industry Press,2007.4.
[3]WANG Quan-fa(汪泉发).Electrolytic coloring of cop-per[J].Electroplating and Pollution Control(in Chi-nese),1988,8(5):10-11.
[4]XU Shu-kai(许书楷),YANG Fang-zu(杨防祖),GE Fu-yun(葛福云),et al.Prepare and structure of elec-trodeposited color chromium coatings[J].Electropla-ting and Pollution Control(in Chinese),1992,11(6):13-17.
[5]ZHENG Fu-yang(郑辅养),MA Ting-chun(马廷椿),WEN Guo-mou(温国谋).Coloring of plating copper[J].Materials Protection(in Chinese),1997,30(9):18-19.
[6]LUNChun-hui(栾春晖),XUEYong-qiang(薛永强),HAN Xiu-juan(韩秀娟).Molybdate electrolytic coloring on nickel coating[J].Materials Protection(in Chinese),1999,32(8):11-13.
[7]Azzam R MA,Bashara NM.Ellipsometry and polarized light[M].Amsterdam:North Holland Publishing Comp,1977.283.
[8]Aspnes D E,Kinsbron E,Bacon D D.Optical properties of Au:sample effects[J].Physical ReviewB,1980,21(8):3290-3299.
[9]LEI Jing-lei(雷惊雷),LI Ling-jie(李凌杰),ZHANG Sheng-tao(张胜涛),et al.Studies on corrosion behav-ior of copper electrode in weak alkaline solution[J].Acta Chimica Sinica(in Chinese),2001,59(8):1216-1221.
[10]WANG Jian-qi(王建琪),WU Wen-hui(吴文辉),FENG Da-ming(冯大明).Introduction on XPS/XAES/UPS[M].Shanghai:National Defense Indus-try Press,1992.530.
[11]MU Guo-guang(母国光),ZHAN Yuan-ling(战元龄).Optics[M].Beijing:Peoples’Educations Press,1979.190.
[12]QI Tong-fei(戚同非),WU Yong-gang(吴永刚),LIN Xiao-yan(林小燕),et al.Computer simulation for change of reflected color in film thickness control process[J].Vacuum(in Chinese),2005,42(1):28-32.