Applications of Ellipsometry in the Investigations of Electrode-Solution Interface

Authors

Jing-lei LEI, School of Chemistry and Chemical Engineering, Chongqing University, Chongqing, 400044, China;
Liang-liu WU, School of Chemistry and Chemical Engineering, Chongqing University, Chongqing, 400044, China;
Ling-jie LI, School of Chemistry and Chemical Engineering, Chongqing University, Chongqing, 400044, China;Follow
Sheng-mao WU, School of Chemistry and Chemical Engineering, Chongqing University, Chongqing, 400044, China;
Sheng-tao ZHANG, School of Chemistry and Chemical Engineering, Chongqing University, Chongqing, 400044, China;

Corresponding Author

Ling-jie LI(LJLi@cqu.edu.cn)

Abstract

Ellipsometry is an optical technique with high-sensitivity to quantitatively obtain surface/interface properties such as thickness andrefractive index by analyzing the changes in polarized light reflected from the surface/interface. Its noncontacting and nondestructivenature makes it possible to acquire thein situreal-time information of the change at the surface/interface. Therefore, ellipsometry has been used widely in the electrochemical investigations. In this paper, based on the brief introduction of the measurementprinciple of ellipsometry, the current progress and the future trends of ellipsometry in electrochemistry arediscussed. The applications of ellipsometry in the fields of conversion and storage of electrochemical energy, electrochemistry ofmaterials science,electroanalysisand bioelectrochemistry are reviewed.

Graphical Abstract

Keywords

ellipsometry, spectroelectrochemistry, interface, surface

DOI Link

https://doi.org/10.61558/2993-074X.2095

Publication Date

2013-02-28

Online Available Date

2012-07-05

Revised Date

2012-06-30

Received Date

2012-06-04

Recommended Citation

Jing-lei LEI, Liang-liu WU, Ling-jie LI, Sheng-mao WU, Sheng-tao ZHANG. Applications of Ellipsometry in the Investigations of Electrode-Solution Interface[J]. Journal of Electrochemistry, 2013 , 19(1): 29-36.
DOI: 10.61558/2993-074X.2095
Available at: https://jelectrochem.xmu.edu.cn/journal/vol19/iss1/2