Abstract
The formation of natural oxide films on polycrystalline zinc surface, the growth of natural oxide films in different atmospheres, as well as the electrochemical process of metal zinc in alkaline carbonate solution, studied recently by using spectroscopic ellipsometry in our group, are introduced. The objective of this paper is to outline that the optical, electrical properties, the change and growth kinetics of zinc metal oxide film on the surface can be investigated by in-situ and ex-situ ellipsometry, which makes significant sense to evaluate the overall performance of zinc oxide layer.
Graphical Abstract
Keywords
spectroscopic ellipsometry, zinc, native oxide films；optical property;electronic property, growth kinetics
Publication Date
2013-10-28
Online Available Date
2013-04-22
Revised Date
2013-04-22
Received Date
2013-02-21
Recommended Citation
Juan ZUO, Ying CHEN, Chang-jian LIN, Andreas ERBE.
An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry[J]. Journal of Electrochemistry,
2013
,
19(5): 409-417.
DOI: 10.61558/2993-074X.2130
Available at:
https://jelectrochem.xmu.edu.cn/journal/vol19/iss5/3
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