An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry

Authors

Juan ZUO, School of Materials Science and Engineering, Xiamen University of Technology, Xiamen 361024, Fujian, China;Follow
Ying CHEN, Max-Planck-Institut für Eisenforschung GmbH, Department of Interface Chemistry and Surface Engineering, Max-Planck-Str. 1, 40237 Düsseldorf, Germany;
Chang-jian LIN, College of Chemistry and Chemical Engineering, Xiamen UniversityXiamen 361005, Fujian, China;
Andreas ERBE, Max-Planck-Institut für Eisenforschung GmbH, Department of Interface Chemistry and Surface Engineering, Max-Planck-Str. 1, 40237 Düsseldorf, Germany;

Corresponding Author

Juan ZUO(zuojuan@xmut.edu.cn)

Abstract

The formation of natural oxide films on polycrystalline zinc surface, the growth of natural oxide films in different atmospheres, as well as the electrochemical process of metal zinc in alkaline carbonate solution, studied recently by using spectroscopic ellipsometry in our group, are introduced. The objective of this paper is to outline that the optical, electrical properties, the change and growth kinetics of zinc metal oxide film on the surface can be investigated by in-situ and ex-situ ellipsometry, which makes significant sense to evaluate the overall performance of zinc oxide layer.

Graphical Abstract

Keywords

spectroscopic ellipsometry, zinc, native oxide films；optical property;electronic property, growth kinetics

DOI Link

https://doi.org/10.61558/2993-074X.2130

Publication Date

2013-10-28

Online Available Date

2013-04-22

Revised Date

2013-04-22

Received Date

2013-02-21

Recommended Citation

Juan ZUO, Ying CHEN, Chang-jian LIN, Andreas ERBE. An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry[J]. Journal of Electrochemistry, 2013 , 19(5): 409-417.
DOI: 10.61558/2993-074X.2130
Available at: https://jelectrochem.xmu.edu.cn/journal/vol19/iss5/3