Abstract
Changes in specular reflectivity,weight loss,surface topograph and potential with time and current-potential curves during chemical polishing were determined.The results showed that chemical polishing was composed of the etching,polishing and pitting stage.The passivating film theory also applied to the chemical polishing.
Keywords
Copper, chemical polishing, Reflectivity, surface topograph
Publication Date
1996-08-28
Online Available Date
1996-08-28
Revised Date
1996-08-28
Received Date
1996-08-28
Recommended Citation
Keping Han, Jingli Fang.
Electrochemical Studies on Chemical Polishing of Copper[J]. Journal of Electrochemistry,
1996
,
2(3): 310-313.
DOI: 10.61558/2993-074X.1341
Available at:
https://jelectrochem.xmu.edu.cn/journal/vol2/iss3/12
References
1高桥英明,永山政一.化学抛光铝.金属表面技术,1985,36:972ArrowsmithDJ,CunninghamPJ.Chemiealpolishingofaluminium.TransIMF,1980,58:1323TakashiS.Historyforpolishing.J.Met.Finish.Soc.Jpn.,1963,14:129
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