Abstract
Lithium plating has huge impact on the lifetime and safety of lithium-ion cells. It is, therefore, necessary to identify lithium plating. In this study, the accelerated stress tests of lithium-ion cells were conducted under different conditions with multi-stress loads. Based on the different effects of the two major aging mechanisms, namely, SEI (Solid Electrolyte Interface) layer growth and lithium plating, on the degradation behaviors, two lithium plating identification methods of resistance-capacity plot and Arrhenius plot were employed. The experimental results revealed that the two identification methods are highly consistent with each other. Furthermore, the origins of capacity loss were distinguished and the degradation mechanisms were investigated with the differential voltage analysis methods, while the cells were disassembled and the elemental compositions of the anodes were analyzed by energy dispersive spectroscopy (EDS). The results verified the applicability of the two lithium plating identification methods. The advantages of the methods developed in this study are that the capacities and resistances of the cells at different aging cycles could be readily measured without dissembling the cell. In addition, these two methods are highly sensitive, as it allows the trace amount of plated lithium in a single cycle to be accumulated among numbers of cycles. The methods proposed in this study are of great significance to the accelerated stress test, durable use and safe operation of lithium-ion cells.
Graphical Abstract
Keywords
Lithium-ion cells, Lithium plating identification, Degradation behaviors, Resistance-capacity plot, Arrhenius Law
Publication Date
2016-12-28
Online Available Date
2016-07-14
Revised Date
2016-07-06
Received Date
2016-05-27
Recommended Citation
Jian-bo ZHANG, Lai-suo SU, Xin-yu LI, Hao GE, Ya-kun ZHANG, Zhe LI.
Lithium Plating Identification from Degradation Behaviors of Lithium-Ion Cells[J]. Journal of Electrochemistry,
2016
,
22(6): 160561.
DOI: 10.13208/j.electrochem.160561
Available at:
https://jelectrochem.xmu.edu.cn/journal/vol22/iss6/14
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