Study of Co(2.5 nm)/Pt(2.5 nm) n(n ≥50) Multilayer by Electrocrystallization

Authors

Renhe Yin
Weiming Cao
Yanpin Guo
Huifen Ji

Corresponding Author

Renhe Yin

Abstract

The electrocrystallization of Co(2.5 nm)/Pt(2.5 nm) n (n ≥50) multilayer has been carried out under potential control, based on observation of reflection electron microscopy (REM). Monatomic steps on Pt single crystal surfaces have been imaged using a conventional transmission electron microscope in the reflection made. The REM images have revealed three dimintional growth of Co electrocrystallization at high polarization of -1.15 V (vs.Hg/Hg 2SO 4). The structure of the specimen was examined by small or high angle X ray diffration technique. The modulation period of a multilayered structure is 5.0 nm.

Keywords

Electrocrystallization, Co/Pt n multilayer, REM, X ray diffration

DOI Link

https://doi.org/10.61558/2993-074X.3121

Publication Date

1997-08-28

Online Available Date

1997-08-28

Revised Date

1997-08-28

Received Date

1997-08-28

Recommended Citation

Renhe Yin, Weiming Cao, Yanpin Guo, Huifen Ji. Study of Co(2.5 nm)/Pt(2.5 nm) n(n ≥50) Multilayer by Electrocrystallization[J]. Journal of Electrochemistry, 1997 , 3(3): Article 3.
DOI: 10.61558/2993-074X.3121
Available at: https://jelectrochem.xmu.edu.cn/journal/vol3/iss3/3