Abstract
Ellipsometric measurements are often extremely sensitive to the presence of very thin surface layers,to changes in their thickness(or coverage),and to changes in surface topography at an atomic scale.These characteristics make the use of ellipsometry for electrochemical studies particularly attractive.The ellipsometric studies on electrochemistry and its applications carried out in the Electrochemical Laboratory of Chongqing University are reviewed briefly: 1)The studies on electrochemistry of classical ellipsometry: 2)The new function V op suggested by the authors. 3)The applications of new approcaches with new function V op suggested by the authors.
Keywords
Ellipsometry, Optical tracking rate, Potential scanning ellipsometry, Stripping ellipsometry
Publication Date
1999-08-28
Online Available Date
1999-08-28
Revised Date
1999-08-28
Received Date
1999-08-28
Recommended Citation
Zongqing Huang, Shengtao Zhang, Shangfen Xie, Changguo Chen, Yuru Yang, Wei Zhu.
Spectroellipsometric Studies on Electrochemistry and its Application[J]. Journal of Electrochemistry,
1999
,
5(3): Article 7.
DOI: 10.61558/2993-074X.3183
Available at:
https://jelectrochem.xmu.edu.cn/journal/vol5/iss3/7
