Further Evidence for Surface Properties of Porous Silicon Resulting in Electroluminescence

Authors

Zhan-jun ZHANG, College of Chemistry and Molecular Engineering, Peking University, Beijing 100871;Chemistry Department of Graduate School of Chinese Academic Sciences, B;
Bin WU, College of Chemistry and Molecular Engineering, Peking University, Beijing 100871;
Jing-jian LI, ollege of Chemistry and Molecular Engineering, Peking University, Beijing 100871;
Zhong-fan LIU, College of Chemistry and Molecular Engineering, Peking University, Beijing 100871;
Sheng-min CAI, College of Chemistry and Molecular Engineering, Peking University, Beijing 100871;

Abstract

The electroluminescence of porous silicon in solutions at positive biases was investigated by luminescence spectrometer. The electroluminescence of porous silicon in solutions mainly depended on its surface properties. The elelctroluminescence was much enhanced when the sample of porous silicon was electrolyzed once again which had undergone an electroluminescence test. The tests of both cyclic voltammetry and the luminescence of the sample of porous silicon prepared by repeated electrolysis provided further evidence that the electroluminescence of porous silicon in solutions at positive biases stemmed from the oxidation of Si_H on the surface of porous silicon. The voltage tunable emitting for porous silicon in formic acid_sodium formate solution at positive biases was revealed, which could be explained with the quantum confinement effect.

Keywords

porous silicon, electroluminescence, formic acid_sodium formate, electrolysis, cyclic voltammetry

DOI Link

https://doi.org/10.61558/2993-074X.3274

Publication Date

2002-02-28

Online Available Date

2002-02-28

Revised Date

2002-02-28

Received Date

2002-02-28

Recommended Citation

Zhan-jun ZHANG, Bin WU, Jing-jian LI, Zhong-fan LIU, Sheng-min CAI. Further Evidence for Surface Properties of Porous Silicon Resulting in Electroluminescence[J]. Journal of Electrochemistry, 2002 , 8(1): Article 8.
DOI: 10.61558/2993-074X.3274
Available at: https://jelectrochem.xmu.edu.cn/journal/vol8/iss1/8

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