Authors
Huai-guo HUANG , Xiamen Zijin Science and Technology Co.LTD., Xiamen 361000, China; Fujian Zijin Research Institute of Minning and Metallurgy, Fujian Zijin Mining Industry Co.,LTD., Longyan 364200, China
Yan-yan XI , State Key Laboratory for Physical Chemistry of the Solid Surface, Department of Chemistry, Institute of Physical Chemistry, Xiamen University, Xiamen 361005, China
Zhi-xin ZHENG , State Key Laboratory for Physical Chemistry of the Solid Surface, Department of Chemistry, Institute of Physical Chemistry, Xiamen University, Xiamen 361005, China
Jia-wei YAN , State Key Laboratory for Physical Chemistry of the Solid Surface, Department of Chemistry, Institute of Physical Chemistry, Xiamen University, Xiamen 361005, China
Jian-zhang ZHOU , State Key Laboratory for Physical Chemistry of the Solid Surface, Department of Chemistry, Institute of Physical Chemistry, Xiamen University, Xiamen 361005, China
Ling-ling WU , State Key Laboratory for Physical Chemistry of the Solid Surface, Department of Chemistry, Institute of Physical Chemistry, Xiamen University, Xiamen 361005, China
Zhong-hua LIN , State Key Laboratory for Physical Chemistry of the Solid Surface, Department of Chemistry, Institute of Physical Chemistry, Xiamen University, Xiamen 361005, China Follow
Corresponding Author
Zhong-hua LIN(zhlin@xmu.edu.cn)
Abstract
CdS nanoparticle films were prepared on the PANI film, PATP film, Au film and ITO respectively by constant current deposition or current impulse method, and their structure and character were also studied. The results show that the substrates influence the structure and character of CdS particle film.
Keywords
CdS, Nanoparticle film, Preparation, Characterization
Publication Date
2002-05-28
Online Available Date
2002-05-28
Recommended Citation
Huai-guo HUANG, Yan-yan XI, Zhi-xin ZHENG, Jia-wei YAN, Jian-zhang ZHOU, Ling-ling WU, Zhong-hua LIN.
The Preparation and Characterization of Growing Preferentially CdS Nanopartile Film[J]. Journal of Electrochemistry ,
2002
,
8(2): 195-201.
DOI: 10.61558/2993-074X.3288
Available at:
https://jelectrochem.xmu.edu.cn/journal/vol8/iss2/14
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